This supplement to Circuits by Ulaby and Maharbiz contains 40 additional end-of-chapter problems designed for three-way solution: analytical, simulation, and measurement. After solving the problem analytically the student continues by solving the same problem with NI Multisim and then once again with NI myDAQ computer-based instrumentation and circuit components. By iterating on each dimension of the problem until all three agree students “triangulate on the truth” and develop confidence in their analytical and laboratory skills.
Each problem requests at least one common numerical value for comparison among the three methods. The percent difference between simulated and analytical results as well as measured-to-analytical results indicates the degree to which the student has achieved a correct solution. Normally simulation and analytical results agree to within a percentage point, and measurements often agree with analytical results to within five percent.
The problems are organized as four per chapter for Chapters 2 through 9 and also chapter 12 of Circuits. The table of contents indicates the associated section number of the textbook in parentheses. Each problem contains the problem statement and sufficient detail to guide the student through the simulation and physical measurement steps. Short video tutorials are linked to each problem to provide detailed guidance on Multisim techniques and ELVISmx computer-based instruments for the myDAQ.
This document is fully hyperlinked for section and figure references. All videos are included in-line, and additionally live hyperlinks are included to the on-line versions in case flash or javascript are disabled.
Students should document their work in sufficient detail so that it could be replicated by others. Present your work on the “Analysis” section as you would on a standard problem set. Be sure to include a “Given” section with your own drawing of the circuit diagram, a “Find” section that lists the requested results for the problem, a detailed solution process, and a clearly-identified end result. Do all of this work on engineering green paper or in a lab book or as otherwise required by your instructor.
The “Simulation” section presents your work to set up the circuit simulation in NI Multisim and the simulation results you used to obtain meaningful information. Create a word processing document that contains an organized set of screenshots with highlights and annotations as well as text to lead the reader through the screenshots. Include the circuit schematic and dialog box setup parameters for information not already visible on the schematic – circle parameters that you entered or changed away from default values. Also include simulation results, again circling control settings that you changed and highlighting regions where you obtained information. Figure 1.1 illustrates a screenshot from NI Multisim properly highlighted to indicate control settings that were adjusted away from default values as well as regions on the screen where measurements were obtained. Interpret the simulation results by writing them in standard form including units, and write any additional calculations that were necessary to reach an end result for simulation.
NOTE: Screen shots in Microsoft Word 2010 can be easily captured and highlighted as follows:
The “Measurement” section presents your work to set up the physical circuit and NI ELVISmx signal generators and measurement instruments. This section also includes your measurement results. Follow the general guidelines for the “Simulation” section. Your instructor may require a photo of your breadboard circuit and myDAQ connections along with your student ID when you work on the problem outside of scheduled class time. Also include a schematic diagram showing all myDAQ connections.
Finally, the “Summary” section compares the requested numerical results from each of the three methods. Tabulate three results for each requested numerical quantity (analytical, simulation, and measurement) and tabulate two percentage differences for each requested numerical quantity:
I gratefully acknowledge contributions from the following individuals:
Professor Ed Doering
Department of Electrical and Computer Engineering
Rose-Hulman Institute of Technology
Terre Haute, IN 47803
doering@rose-hulman.edu